This inventor holds 7 USPTO granted patents and 4 EPO patents. Top assignee: Fujitsu Corporation. Active years: 2015-2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2015-2016
Title: Innovations of Mitsuru Ochi
Introduction
Mitsuru Ochi is a notable inventor based in Kawasaki, Japan. He has made significant contributions to the field of technology, particularly in radar systems and vehicle measurement apparatuses. With a total of 7 patents to his name, Ochi continues to push the boundaries of innovation.
Latest Patents
One of his latest patents is a radar apparatus and computer-readable storage medium. This radar apparatus is designed to detect objects by utilizing a detecting unit that processes reflected waves from transmitted signals. The system includes a storage unit with two parts: one for storing detection results and another for keeping a copy of that information. A selecting unit allows access to either storage part to retrieve the detection results.
Another significant patent involves an apparatus for measuring vehicle queue length. This invention includes a processor that detects moving vehicles approaching a queue using sensor signals. It calculates the position and speed of the vehicle, determines its stop position, and ultimately measures the length of the vehicle queue based on these calculations.
Career Highlights
Mitsuru Ochi is currently employed at Fujitsu Corporation, where he applies his expertise in developing advanced technological solutions. His work has been instrumental in enhancing the efficiency and accuracy of various systems.
Collaborations
Ochi collaborates with talented coworkers, including Junko Kajiki and Tomonori Ikeya. Their combined efforts contribute to the innovative projects at Fujitsu Corporation.
Conclusion
Mitsuru Ochi's contributions to technology through his patents reflect his dedication to innovation. His work in radar systems and vehicle measurement continues to influence the industry positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
