Aichi, Japan

Mitsuo Yonetani

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignees: Mitsubishi Denki Kabushiki Kaisha, Other. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mitsuo Yonetani. Retrieved from https://idiyas.com/inventor/mitsuo-yonetani

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:

goldMedal1 out of 21,351 
 
Mitsubishi Denki Kabushiki Kaisha
 patents
silverMedal1 out of 834,513 
Other
 patents
where one patent can have more than one assignee

Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: Mitsuo Yonetani: Innovator in Radiation Detection Technology

Introduction

Mitsuo Yonetani is an inventor based in Higashi-Hiroshima-shi, Japan. He has made significant contributions to the field of radiation detection technology. His innovative approaches aim to improve the efficiency and accuracy of radiation detectors.

Latest Patent Applications

Yonetani's latest patent applications include the "PHOSWICH THERMAL NEUTRON DETECTOR." This application addresses the need for a phoswich radiation detector that can easily discriminate between detection signals on gamma rays and thermal neutrons. The detector utilizes two scintillators, one for detecting thermal neutrons and another for gamma rays, ensuring selective signal acquisition. Another application is for a "RADIATION DETECTOR," which enhances the detection efficiency of photodetectors for light emitted by scintillators. This design incorporates an optical wavelength conversion layer to improve operational stability and time resolution.

Conclusion

Mitsuo Yonetani's work in radiation detection technology showcases his commitment to innovation and problem-solving in the field. His latest patent applications reflect his dedication to advancing detection methods and improving efficiency.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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