Mitsuo Ogasawara

Title: Mitsuo Ogasawara: Innovator in Electron Microscopy

Introduction

Mitsuo Ogasawara is a notable inventor based in Katsuta, Japan. He has made significant contributions to the field of electron microscopy, holding two patents that enhance the functionality and precision of electron microscopes. His work has been influential in advancing imaging techniques used in various scientific applications.

Latest Patents

Ogasawara's latest patents include a bi-axial-tilting specimen fine motion device and a method of correcting image shifting during the tilting of a specimen in a eucentric side entry goniometer stage. This innovative device is controlled in five axes of specimen positions (x, y, z) and specimen tilt angles (θx, θy). The technology automatically corrects the shifting of the observed image by calculating correction values based on specific equations, ensuring accurate imaging even when the tilt angle varies.

Career Highlights

Throughout his career, Mitsuo Ogasawara has worked with prominent companies such as Hitachi, Ltd. and Hitachi Science Systems, Ltd. His experience in these organizations has allowed him to develop and refine his inventions, contributing to advancements in electron microscopy.

Collaborations

Ogasawara has collaborated with notable colleagues, including Hiroyuki Kobayashi and Koichi Kanaya. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.

Conclusion

Mitsuo Ogasawara's contributions to electron microscopy through his patents and collaborations highlight his role as a significant innovator in the field. His work continues to impact scientific research and imaging technologies.