Munich, Germany

Miriam Van De Löcht

This inventor holds 1 USPTO granted patent. Top assignee: Knorr-Bremse Systeme Fur Schienenfahrzeuge Gmbh. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Miriam Van De Löcht. Retrieved from https://idiyas.com/inventor/miriam-van-de-löcht

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2016

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovations of Miriam Van De Löcht

Introduction

Miriam Van De Löcht is a notable inventor based in Munich, Germany. She has made significant contributions to the field of rail vehicle technology. Her innovative work focuses on enhancing the safety and efficiency of braking systems.

Latest Patents

Miriam holds a patent for a "Brake control device for a brake system of a rail vehicle." This invention is designed to detect strain during the braking process on at least one friction brake device. The brake control device also stores wear data based on the detected strain in a memory device. This technology is crucial for improving the reliability and performance of rail vehicles.

Career Highlights

Miriam is currently employed at Knorr-Bremse Systeme für Schienenfahrzeuge GmbH. Her role involves developing advanced braking systems that enhance the safety of rail transport. With her expertise, she has contributed to the evolution of braking technologies in the rail industry.

Collaborations

Miriam has worked alongside talented colleagues such as Marc-Gregory Elstorpff and Marco Nock. Their collaborative efforts have led to advancements in rail vehicle safety and performance.

Conclusion

Miriam Van De Löcht's contributions to rail vehicle technology through her innovative patent demonstrate her commitment to enhancing safety in transportation. Her work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…