Kitamoto, Japan

Minoru Tanaka

This inventor holds 1 USPTO granted patent. Top assignee: Izumi Industries, Ltd.. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Minoru Tanaka. Retrieved from https://idiyas.com/inventor/minoru-tanaka-4znfsi0q

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1991

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Minoru Tanaka: Innovator in Cutting Technology

Introduction

Minoru Tanaka is a notable inventor based in Kitamoto, Japan. He has made significant contributions to the field of cutting technology, particularly with his innovative designs that enhance the efficiency and precision of cutting processes.

Latest Patents

Tanaka holds a patent for a cutting apparatus designed for forming a noncircular cross-section on a workpiece. This apparatus features a tool advancing and retreating device that includes a central shaft for tool mounting, a journal for support, and a movable plate. The design incorporates electromagnets positioned to facilitate the movement of the plate, along with various sensors to monitor and control the cutting process effectively.

Career Highlights

Minoru Tanaka is associated with Izumi Industries, Ltd., where he has applied his expertise in cutting technology. His work has contributed to advancements in manufacturing processes, making them more efficient and precise.

Collaborations

Tanaka has collaborated with notable colleagues such as Toshiro Higuchi and Hazime Izumi, further enhancing the innovative capabilities of his team.

Conclusion

Minoru Tanaka's contributions to cutting technology exemplify the impact of innovation in manufacturing. His patent and collaborative efforts continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…