This inventor holds 2 USPTO granted patents. Top assignee: Mitsubishi Denki Kabushiki Kaisha. Active years: 1991.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1991
Title: Minoru Akiyama: Innovator in Fine-Particle Measurement Technology
Introduction
Minoru Akiyama is a distinguished inventor based in Hyogo, Japan. He has made significant contributions to the field of fine-particle measurement technology, holding a total of 2 patents. His work focuses on enhancing the precision and efficiency of measuring fine particles in semiconductor manufacturing processes.
Latest Patents
Akiyama's latest patents include a Fine-Particle Measuring Apparatus and a System for Detecting Minute Particles on or Above a Substrate. The Fine-Particle Measuring Apparatus is designed to measure fine particles attached to the surface of a semiconductor substrate and those suspended in the space above it. This apparatus utilizes laser beam scattering to achieve high spatial resolution without disturbing the processing environment. The system comprises a laser light phase modulator, an optical system, a photodetector, and a signal processor, all working in unison to provide accurate measurements.
The System for Detecting Minute Particles also employs laser technology to measure fine particles on a substrate. It features a laser beam scanning mechanism that minutely modulates the angular position of the laser beam, allowing for high sensitivity in detection. Similar to his other invention, this system ensures minimal disruption to the processing unit while delivering precise measurements.
Career Highlights
Minoru Akiyama is currently employed at Mitsubishi Electric Corporation, where he continues to innovate in the field of semiconductor technology. His expertise in fine-particle measurement has positioned him as a key figure in advancing the capabilities of semiconductor manufacturing.
Collaborations
Akiyama has collaborated with notable colleagues such as Masao Koshinaka and Toshimasa Tomoda. Their combined efforts have contributed to the development of cutting-edge technologies in the semiconductor industry.
Conclusion
Minoru Akiyama's contributions to fine-particle measurement technology have significantly impacted the semiconductor manufacturing process. His innovative patents and ongoing work at Mitsubishi Electric Corporation highlight his dedication to advancing this critical field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
