Austin, TX, United States of America

Mini Nanua


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Mini Nanua - Innovator in Electromigration Check Schemes

Introduction

Mini Nanua is an accomplished inventor based in Austin, TX (US). He has made significant contributions to the field of electronic design automation through his innovative patent. His work focuses on improving the reliability of electronic components by addressing electromigration issues.

Latest Patents

Mini Nanua holds a patent for a methodology titled "Context-aware reliability checks." This patent involves an electromigration (EM) check scheme designed to reduce pessimism regarding current density limits by checking wire context. The methodology applies existing electronic design automation (EDA) flows and tools to identify potentially failing wires based on a worst-case EM check using conservative foundry current density limits. A more accurate, context-specific check can be performed on these potentially failing wires to eliminate those that do not experience worst-case conditions and meet current density limits based on their actual context. This allows designers to correct the remaining wires that are not eliminated by the context-specific check.

Career Highlights

Mini Nanua is currently employed at Apple Inc., where he continues to innovate and contribute to advancements in electronic design. His work has garnered attention for its practical applications in improving the reliability of electronic devices.

Collaborations

Mini collaborates with talented coworkers, including Antonietta Oliva and Karthik Rajagopal. Their combined expertise fosters a creative environment that drives innovation within their projects.

Conclusion

Mini Nanua's contributions to electromigration check schemes exemplify the importance of context-aware methodologies in electronic design. His innovative approach not only enhances the reliability of electronic components but also showcases the potential for future advancements in the field.

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