Company Filing History:
Years Active: 2019
Title: **Innovative Contributions of MinHyuk Kim in Microscale Measurement Technologies**
Introduction
MinHyuk Kim is a notable inventor based in Daejeon, South Korea, recognized for his contributions to the field of microscale measurement technologies. With a strong academic and research background, he has made significant strides in understanding the properties of surfaces through innovative methods and systems.
Latest Patents
MinHyuk Kim holds a patent for a "Method and system for simultaneously measuring surface normal vector and surface reflectance function in microscale." This unique system is designed to efficiently measure both the surface normal vector and surface reflection function of objects at a microscale level. It utilizes a light dome structure composed of LEDs for illuminating the object, coupled with a macro lens camera positioned above to capture detailed images. Furthermore, an xyz micro-translation stage allows for precise adjustments of the focal distance, ensuring accurate measurement. The integrated measurement unit controls the entire setup to obtain images while simultaneously executing the required measurements.
Career Highlights
Currently, MinHyuk Kim is associated with the Korea Advanced Institute of Science and Technology, a prominent institution known for its innovative research and development in science and technology. His work focuses on bridging the gap between theory and practical application in the realm of microscale measurements, thereby contributing to advancements in various scientific fields.
Collaborations
Throughout his career, MinHyuk Kim has collaborated with esteemed colleagues such as Giljoo Nam and Joo Ho Lee. These partnerships foster an environment of shared knowledge and innovation, enhancing the research output and contributing to the body of work in their respective fields.
Conclusion
MinHyuk Kim’s dedication to innovation and his patent in microscale measurement technologies reflects the potential to impact numerous domains, including materials science, optics, and engineering. His ongoing contributions at the Korea Advanced Institute of Science and Technology, combined with valuable collaborations, promise to pave the way for further advancements in the realm of surface measurement technologies.