Ningde, China

Mingwei Yan

This inventor holds 1 USPTO granted patent. Top assignee: Contemporary Amperex Technology (Hong Kong) Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mingwei Yan. Retrieved from https://idiyas.com/inventor/mingwei-yan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Mingwei Yan and Battery Charging Innovation.

Introduction

Mingwei Yan is an inventor associated with Ningde, China, and Contemporary Amperex Technology (Hong Kong) Limited. His patent work addresses battery charging and the measurement of direct current resistance during charging.

Latest Patents

Yan is associated with 1 patent: “Direct Current Resistance Detection Method for Batteries, System, Device, and Storage Medium.” The invention applies multiple discharging current pulses during constant-current charging, creating a negative-pulse charging mode. These pulses can reduce cell polarization and may improve charging acceptance, shorten charging time, and increase charging efficiency. By measuring battery voltage during a discharge pulse and again during the subsequent constant-current charging period, the method also determines the battery’s direct current resistance under charging conditions.

Career Highlights

Yan’s listed patent connects battery charging control with resistance measurement, enabling the battery’s direct current resistance to be detected during negative-pulse charging. His company affiliation is Contemporary Amperex Technology (Hong Kong) Limited.

Collaborations

Ming Ni and Haili Li are identified as Yan’s coworkers.

Conclusion

Mingwei Yan’s patent focuses on combining pulse-based charging with in-process resistance detection, contributing a practical approach to battery charging and evaluation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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