San Diego, CA, United States of America

Mingwei Xu

This inventor holds 1 USPTO granted patent. Top assignee: Brain Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mingwei Xu. Retrieved from https://idiyas.com/inventor/mingwei-xu-kzbj5m1d

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Mingwei Xu and His Patent in Retail Analytics.

Introduction

Mingwei Xu is an inventor based in San Diego, California. His work includes a patent for identifying exceptions in feature detection analytics, with an application to product displays and retail operations.

Latest Patents

Xu is associated with 1 patent, titled “Systems and Methods for Identifying Exceptions in Feature Detection Analytics.” The invention describes systems that identify exceptions in product displays. For example, it can report price-tag mismatches when criteria are met using optical character recognition, image object detection, and reference catalogs or planograms. These alerts can give people working alongside robots actionable information to investigate and resolve discrepancies.

Career Highlights

Xu works at Brain Corporation. His patent focuses on applying analytics to product-display monitoring and helping surface issues that may require human attention.

Collaborations

Xu’s listed coworkers include Andrew Hekman and Kiel Martin Groeniger. The patent’s described approach also supports collaboration between automated systems and people by helping teams identify and address display exceptions.

Conclusion

Mingwei Xu’s patent describes a practical use of computer vision and reference data to detect retail display exceptions, including price-tag mismatches, and support their resolution.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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