Shanghai, China

MingShen Kuo


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 37(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of MingShen Kuo

Introduction

MingShen Kuo is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of semiconductor technology. His innovative approach has led to the development of a unique method for detecting the circular uniformity of semiconductor circular contact holes.

Latest Patents

MingShen Kuo holds a patent for a method titled "Method of detecting the circular uniformity of the semiconductor circular contact holes." This invention involves several detection circuit structures disposed on a semiconductor wafer. The method utilizes N-type and P-type active regions, separated by silicon dioxide layers, to effectively assess the circular uniformity of contact holes. An electron beam scanner is employed to detect the circular uniformity, providing a comprehensive reflection of the contact holes' characteristics. He has 1 patent to his name.

Career Highlights

Kuo is currently associated with Shanghai Huali Microelectronics Corporation, where he continues to push the boundaries of semiconductor technology. His work has been instrumental in enhancing the efficiency and reliability of semiconductor devices.

Collaborations

MingShen Kuo has collaborated with notable colleagues, including Kai Wang and Hunglin Chen. Their combined expertise has contributed to advancements in the semiconductor field.

Conclusion

MingShen Kuo's innovative methods and dedication to semiconductor technology have established him as a key figure in the industry. His contributions continue to influence the development of more efficient semiconductor devices.

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