Yantai, China

Mingjie Lu

This inventor holds 1 USPTO granted patent. Top assignee: Yantai University. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mingjie Lu. Retrieved from https://idiyas.com/inventor/mingjie-lu-hdqfdie1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations of Mingjie Lu in Blockchain Technology

Introduction

Mingjie Lu is a prominent inventor based in Yantai, China. He has made significant contributions to the field of blockchain technologies. His work focuses on enhancing the security and efficiency of blockchain systems.

Latest Patents

Mingjie Lu holds a patent for a "Method, system and device for detecting abnormal node in blockchain and storage medium." This invention relates to the detection of abnormal nodes within a blockchain. The detection method involves extracting and analyzing node data through various information sources. Ultimately, it results in a high-quality graph structure that boasts high accuracy, strong applicability, and minimal error. This innovation facilitates the extraction of high-order neighbor features, which are rich in information. Consequently, it improves the accuracy of detection results and contributes to maintaining the safety of blockchain systems.

Career Highlights

Mingjie Lu is affiliated with Yantai University, where he continues to advance his research in blockchain technologies. His work has garnered attention for its practical applications in enhancing blockchain security.

Collaborations

Mingjie Lu collaborates with Zhaowei Liu, contributing to the development of innovative solutions in the blockchain domain.

Conclusion

Mingjie Lu's contributions to blockchain technology exemplify the potential of innovative methods to enhance security and efficiency in digital systems. His patent reflects a significant advancement in the field, showcasing his expertise and commitment to research.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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