Taipei, Taiwan

MingHung Hsieh

This inventor holds 1 USPTO granted patent. Top assignee: Google Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: MingHung Hsieh. Retrieved from https://idiyas.com/inventor/minghung-hsieh-a1hry9o8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: MingHung Hsieh and Camera-Based Depth Estimation.

Introduction

MingHung Hsieh is an inventor associated with Google Inc. and based in Taipei, Taiwan. His patent work includes a method for estimating the physical distance between a camera and an object using the object’s position in an image.

Latest Patents

Hsieh is associated with 1 patent, titled “Depth Estimation Based on Object Bottom Position.” The method receives image data from a camera and identifies the vertical position of an object’s bottom within the image. It calculates an object-bottom ratio by comparing that position with the image height, then uses a distance projection model to estimate the physical distance between the camera and the object. The model maps candidate object-bottom ratios to corresponding distances, and the method generates an indication of the resulting estimate.

Career Highlights

Hsieh’s listed patent reflects work on computer vision and distance estimation. By using an object’s position in an image as an input to a projection model, the method provides a way to estimate distance from camera imagery.

Collaborations

The provided information lists Shih-Yen Ku and Ray-Hon Sun as Hsieh’s coworkers. Their names are also associated with his professional context at Google Inc.

Conclusion

MingHung Hsieh’s patent describes a camera-based approach to estimating object distance from image position, highlighting his contribution to computer vision technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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