Taoyuan, Taiwan

Ming-Ting Shih

This inventor holds 1 USPTO granted patent. Top assignee: Chung-Shan Institute of Science and Technology. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ming-Ting Shih. Retrieved from https://idiyas.com/inventor/ming-ting-shih

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: The Innovations of Ming-Ting Shih

Introduction

Ming-Ting Shih is a notable inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of projection technology. His innovative work has led to the development of a unique double-projection apparatus.

Latest Patents

Ming-Ting Shih holds a patent for a double-projection apparatus. This apparatus includes a frame, a carrier, two eccentric axles, a mirror-twisting axle, two scanning mirrors, and two piezoelectric actuators. The design allows for enhanced projection capabilities, making it a valuable asset in various applications.

Career Highlights

Ming-Ting Shih is associated with the Chung-Shan Institute of Science and Technology. His work at this institution has allowed him to focus on advancing projection technologies. His dedication to innovation is evident in his patent and ongoing research.

Collaborations

Ming-Ting Shih has collaborated with notable colleagues such as Sheng-Chih Shen and Ta-Ching Li. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Ming-Ting Shih's contributions to the field of projection technology exemplify his innovative spirit and dedication to advancing the industry. His patent for the double-projection apparatus showcases his ability to create practical solutions that enhance technological capabilities.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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