Hsinchu, Taiwan

Ming-Mu Hsieh

This inventor holds 2 USPTO granted patents. Top assignee: Umax Data Systems, Inc.. Active years: 1997-1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ming-Mu Hsieh. Retrieved from https://idiyas.com/inventor/ming-mu-hsieh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.7

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1997-1999

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2 patents (USPTO):Explore Patents

Title: Innovations by Ming-Mu Hsieh

Introduction

Ming-Mu Hsieh is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of image input systems, holding 2 patents that showcase his innovative approaches to scanning technology.

Latest Patents

Hsieh's latest patents include a "Batch scanning method for an image input system" and a "Method for scanning multiple images in one scanning process." The batch scanning method involves sorting multiple image areas and calibrating the image input system to ensure accurate scanning. This method enhances efficiency by allowing the system to scan multiple areas sequentially. The second patent introduces a novel approach to scanning multiple images simultaneously using a frame holder that facilitates scan area recognition and orientation. This innovation allows for a more streamlined scanning process, improving productivity in image processing.

Career Highlights

Ming-Mu Hsieh has been instrumental in advancing scanning technologies through his work at Umax Data Systems, Inc. His expertise in image input systems has positioned him as a key figure in the industry, contributing to the development of efficient scanning methods.

Collaborations

Hsieh has collaborated with notable coworkers such as Wei-Jen Huang and Alpha Tsay, further enhancing the innovative capabilities of his projects.

Conclusion

Ming-Mu Hsieh's contributions to scanning technology through his patents reflect his commitment to innovation and efficiency in image processing. His work continues to influence advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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