Shanghai, China

Ming Gan

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Purdue Research Foundation. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ming Gan. Retrieved from https://idiyas.com/inventor/ming-gan-505i5az1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Innovations of Ming Gan in Nanomechanical and Micromechanical Stress Measurement

Introduction

Ming Gan is an accomplished inventor based in Shanghai, China. He has made significant contributions to the field of nanomechanics and micromechanics through his innovative research and patents. His work focuses on the intricate relationship between mechanical stress and thermal profiles in nanoscale and microscale structures.

Latest Patents

Ming Gan holds a patent titled "In-situ combined sensing of uniaxial nanomechanical and micromechanical stress with simultaneous measurement of surface temperature profiles by Raman shift in nanoscale and microscale structures." This patent involves separating a measured Raman shift signal into mechanical and thermal components when a uniaxial compressive load is applied in situ. The invention allows for the application of uniaxial compressive loads on examined specimens from room temperature to 150°C. It also enables Raman shift measurements as a function of strain at constant temperature and/or as a function of temperature at constant strain levels. The innovation realizes that the Raman shift measured at a given temperature under a specific level of applied stress can be expressed as a summation of stress-induced and temperature-induced Raman shift signals measured separately. This separation of Raman shift signals is utilized to measure localized changes in thermal conductivity and/or mechanical stress of structures, such as semiconductor structures, under applied stress.

Career Highlights

Ming Gan has had a notable career, contributing to advancements in the field of materials science and engineering. His research has implications for various applications, particularly in the semiconductor industry. He is recognized for his expertise in the measurement and analysis of mechanical and thermal properties at the nanoscale.

Collaborations

Ming Gan collaborates with Vikas Tomar, enhancing the research output and innovation in their field. Their partnership exemplifies the importance of teamwork in scientific research and development.

Conclusion

Ming Gan's innovative work in the measurement of mechanical and thermal properties at the nanoscale has significant implications for various industries. His contributions continue to advance the understanding of material behavior under stress, paving the way for future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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