This inventor holds 1 USPTO granted patent. Top assignee: Kla Coporation. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: The Innovations of Ming Di
Introduction
Ming Di is a notable inventor based in Milpitas, CA (US). He has made significant contributions to the field of semiconductor technology. His work focuses on the measurement of semiconductor structures, which is crucial for advancements in various electronic applications.
Latest Patents
Ming Di holds a patent for "Measurements of semiconductor structures based on spectral differences at different process steps." This patent presents methods and systems for measuring values of one or more parameters of interest, including changes in these values based on measured spectral differences. A trained spectral difference-based measurement model determines these changes by analyzing differences in spectra measured before and after one or more process steps. The patent outlines various methods for determining spectral differences, including differences in measured intensity and harmonic signal values.
Career Highlights
Ming Di is currently employed at Kla Corporation, where he applies his expertise in semiconductor measurements. His innovative approaches have contributed to the company's advancements in technology. He has a proven track record of developing methods that enhance the accuracy and efficiency of semiconductor measurements.
Collaborations
Ming Di has collaborated with notable colleagues, including Qiang Zhao and Tianhao Zhang. Their combined efforts have led to significant advancements in their field, showcasing the importance of teamwork in innovation.
Conclusion
Ming Di's contributions to semiconductor technology through his patent and work at Kla Corporation highlight his role as an influential inventor. His innovative methods for measuring semiconductor structures pave the way for future advancements in the industry.