Shanghai, China

Minfang Wei

This inventor holds 1 USPTO granted patent. Top assignee: Shanghai Xiaoyi Technology Co., Ltd.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Minfang Wei. Retrieved from https://idiyas.com/inventor/minfang-wei

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Minfang Wei - Innovator in Panoramic Camera Technology

Introduction

Minfang Wei is a prominent inventor based in Shanghai, China. He is known for his innovative contributions to camera technology, particularly in the development of panoramic cameras. With a focus on enhancing imaging capabilities, Wei has made significant strides in the field of photography.

Latest Patents

Minfang Wei holds a patent for a panoramic camera, showcasing his expertise in creating advanced imaging solutions. This patent represents his commitment to pushing the boundaries of technology and improving user experiences in photography.

Career Highlights

Wei is currently employed at Shanghai Xiaoyi Technology Co., Ltd., where he continues to work on innovative projects. His role at the company allows him to collaborate with other talented professionals in the field, further enhancing his contributions to technology.

Collaborations

Some of Minfang Wei's notable coworkers include Chao He and Bin Sun. Together, they work on various projects that aim to advance camera technology and improve the overall quality of imaging products.

Conclusion

Minfang Wei is a dedicated inventor whose work in panoramic camera technology has made a significant impact in the field. His innovative spirit and collaboration with talented colleagues continue to drive advancements in photography.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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