Tokyo, Japan

Minami Uchiho

This inventor holds 1 USPTO granted patent and 5 published patent applications. Top assignee: Hitachi High-Tech Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Minami Uchiho. Retrieved from https://idiyas.com/inventor/minami-uchiho

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Minami Uchiho: Innovator in Charged Particle Beam Systems

Introduction

Minami Uchiho is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of charged particle beam systems. His innovative work focuses on obtaining information about samples through advanced imaging techniques.

Latest Patents

Uchiho holds a patent for a charged particle beam system. The objective of this patent is to provide a system capable of extracting information from a sample by utilizing features observed in images caused by light interference, light diffraction, and light standing waves. This technology enhances the ability to analyze samples with precision.

Career Highlights

Minami Uchiho is associated with Hitachi High-Tech Corporation, where he applies his expertise in developing cutting-edge technologies. His work has been instrumental in advancing the capabilities of charged particle beam systems.

Collaborations

Uchiho collaborates with talented colleagues, including Heita Kimizuka and Natsuki Tsuno, who contribute to the innovative environment at Hitachi High-Tech Corporation.

Conclusion

Minami Uchiho's contributions to charged particle beam systems exemplify the importance of innovation in technology. His work continues to influence advancements in the field, showcasing the potential of scientific research and development.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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