Company Filing History:
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Years Active: 2019
Title: Min-woo Rhee: Innovator in Semiconductor Manufacturing
Introduction
Min-woo Rhee, based in Seoul, South Korea, is a distinguished inventor known for his contributions to the field of semiconductor manufacturing. With one patented invention to his name, he has made significant strides in improving the efficiency of testing and manufacturing semiconductor devices.
Latest Patents
His notable patent revolves around a probe card, test apparatus including the probe card, and related methods of manufacturing. The innovation provides enhanced manufacturing methods for semiconductor devices, focusing on the design of probe cards and test apparatuses. The patent outlines a unique structure, which consists of a circuit board, a support located underneath, and multiple probe needles. Each probe needle is specifically designed to connect with the side surfaces of conductive bumps on a test target. This invention not only streamlines the testing process of semiconductor devices but also ensures a more effective packaging method.
Career Highlights
Throughout his career, Min-woo Rhee has worked with prominent organizations such as Samsung Electronics Co., Ltd. and the Korea Advanced Institute of Science and Technology. His experience in these esteemed institutions has equipped him with the knowledge and skills necessary to innovate in a demanding technological landscape.
Collaborations
In his professional journey, Rhee has collaborated with other talented individuals, including colleagues Duke Kimm and Jae-Hong Kim. Together, they have contributed to advancements in semiconductor technology and testing methodologies.
Conclusion
Min-woo Rhee's contributions to the field of semiconductor manufacturing through his patent demonstrate his commitment to innovation and improvement. As the technology continues to evolve, his work serves as a foundational element for future advancements in the industry. Rhee stands as a testament to the potential of inventors to drive change and efficiency in critical areas of technology.