Seoul, South Korea

Min Sung Shin

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Lg Cns Co., Ltd.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Min Sung Shin. Retrieved from https://idiyas.com/inventor/min-sung-shin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Min Sung Shin: Innovator in IT System Testing

Introduction

Min Sung Shin is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of information technology, particularly in the area of system testing. His innovative approach focuses on enhancing the efficiency and accuracy of testing IT systems.

Latest Patents

Min Sung Shin holds a patent for a "Method and system for testing a system under development using real transaction data." This patent outlines a method for automatically testing an IT system by utilizing real transaction data. The process includes obtaining a transaction message by capturing network packets, transmitting request data to the system under test, receiving response data, and comparing it to determine success or failure.

Career Highlights

Min Sung Shin is currently employed at LG CNS Co., Ltd., where he applies his expertise in IT system testing. His work has been instrumental in developing more reliable testing methodologies that leverage real-world data.

Collaborations

He has collaborated with notable colleagues, including Yong Sik Kim and Hoil Lee, contributing to advancements in their shared field of expertise.

Conclusion

Min Sung Shin's innovative methods in IT system testing demonstrate his commitment to improving technology through practical applications. His contributions are paving the way for more effective testing processes in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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