Min-Sub Kang

Title: Min-Sub Kang: Innovator in Measurement Technologies

Introduction

Min-Sub Kang is a notable inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of measurement technologies, particularly in the area of fine pattern inspection. With a total of 3 patents to his name, Kang's work has had a substantial impact on the industry.

Latest Patents

Kang's latest patents focus on methods, systems, and computer program products for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles. The first patent describes a process where a pattern is inspected by acquiring a scanning electron microscope picture of an inspection pattern, along with a secondary electron signal profile. A determination is made regarding the defectiveness of the inspection pattern by comparing it to a sample pattern. The second patent reiterates this process, emphasizing the importance of both the scanning electron microscope picture and the secondary electron signal profile in ensuring accurate measurements.

Career Highlights

Min-Sub Kang is currently employed at Samsung Electronics Co., Ltd., a leading company in the electronics industry. His role involves developing innovative solutions that enhance the precision of measurement technologies. His expertise in this area has positioned him as a valuable asset to his team and the company.

Collaborations

Kang has collaborated with notable coworkers, including Sang-Kil Lee and Kwang-Sik Kim. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Min-Sub Kang's contributions to measurement technologies through his patents and work at Samsung Electronics Co., Ltd. highlight his role as a key innovator in the field. His dedication to improving fine pattern inspection methods continues to influence the industry positively.