Changsha, China

Min Liu

This inventor holds 1 USPTO granted patent. Top assignee: Hunan University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Min Liu. Retrieved from https://idiyas.com/inventor/min-liu-g1iytcch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 11.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Min Liu - Innovator in Neural Network-Based Defect Detection

Introduction

Min Liu is a prominent inventor based in Changsha, China. He has made significant contributions to the field of defect detection in aircraft manufacturing. His innovative approach utilizes neural networks to enhance the quality assurance processes in gluing applications on aircraft skin.

Latest Patents

Min Liu holds a patent for a "Neural network-based defect detection method for gluing quality on aircraft skin." This invention outlines a comprehensive method that includes data acquisition through photography, preprocessing of image data, and the establishment of a defect detection network model. The model incorporates various components such as a feature extraction network and a defect prediction network, which work together to ensure high-quality gluing on aircraft surfaces.

Career Highlights

Min Liu is affiliated with Hunan University, where he contributes to research and development in the field of engineering and technology. His work focuses on applying advanced neural network techniques to solve real-world problems in the aerospace industry.

Collaborations

Some of his notable coworkers include Jianxu Mao and Junfei Yi, who collaborate with him on various research projects related to defect detection and quality assurance.

Conclusion

Min Liu's innovative work in neural network-based defect detection represents a significant advancement in ensuring the quality of aircraft manufacturing. His contributions are vital for enhancing safety and efficiency in the aerospace sector.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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