Yongin, South Korea

Min Kyun Doo

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Sds Co., Ltd.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Min Kyun Doo. Retrieved from https://idiyas.com/inventor/min-kyun-doo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Min Kyun Doo - Innovator in Defect Identification Technology

Introduction

Min Kyun Doo is a notable inventor based in Yongin-si, South Korea. He has made significant contributions to the field of defect identification technology. His innovative approach focuses on improving the efficiency of identifying defective equipment in manufacturing processes.

Latest Patents

Min Kyun Doo holds a patent for a "Method and apparatus for identifying root cause of defect using composite defect map." This invention provides a method and apparatus for automatically determining defective equipment by utilizing a sample defect map that shows defect distribution in each cell of a defective sample. The method involves generating a sample defect map, creating an equipment defect map for the equipment involved, and calculating map similarity to identify defective pieces of equipment.

Career Highlights

Min Kyun Doo is currently employed at Samsung SDS Co., Ltd., where he applies his expertise in defect identification. His work has been instrumental in enhancing the quality control processes within the company. He has demonstrated a strong commitment to innovation and problem-solving in the manufacturing sector.

Collaborations

Min Kyun Doo collaborates with Kae Young Shin, a fellow professional in the field. Their partnership has contributed to the development of advanced technologies aimed at improving defect detection and resolution.

Conclusion

Min Kyun Doo's contributions to defect identification technology exemplify the impact of innovative thinking in manufacturing. His work continues to influence the industry and improve quality assurance processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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