Suwon, South Korea

Min Jang

This inventor holds 1 USPTO granted patent and 8 published patent applications. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Min Jang. Retrieved from https://idiyas.com/inventor/min-jang-6qiqt4e4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Min Jang - Innovator in Low-Density Parity Check Decoding

Introduction

Min Jang is an inventor based in Suwon-si, South Korea. He has made significant contributions to the field of communication systems, particularly in the area of low-density parity check (LDPC) decoding. Although he currently holds no granted patents, his innovative ideas are reflected in his latest patent applications.

Latest Patent Applications

Min Jang's recent patent applications focus on advanced techniques for decoding low-density parity check codes. One application, titled "LOW DENSITY PARITY CHECK (LDPC) DECODING," describes a method that involves identifying a set of indices of variable nodes (VNs) with log-likelihood ratios (LLRs) exceeding a certain threshold. The process includes dividing indices of the parity check matrix (PCM) rows into subsets, ordering these subsets based on the number of non-zero row elements, and generating a decoding schedule accordingly. Another application, "DECODING OF LOW-DENSITY PARITY CHECK CODES," outlines a method for iteratively updating check-to-variable (C2V) and variable-to-check (V2C) messages while skipping updates for specific indices.

Conclusion

Min Jang is an emerging inventor whose work in LDPC decoding showcases his innovative approach to communication systems. His latest patent applications reflect his commitment to advancing technology in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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