Seoul, South Korea

Min-Jae Lee


 

Average Co-Inventor Count = 2.7

ph-index = 4

Forward Citations = 53(Granted Patents)


Location History:

  • Daegu, KR (2014)
  • Seoul, KR (1999 - 2019)
  • Suwon-si, KR (2012 - 2023)

Company Filing History:


Years Active: 1999-2023

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14 patents (USPTO):Explore Patents

Title: Min-Jae Lee: Innovator in Semiconductor Technology

Introduction

Min-Jae Lee is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of semiconductor technology, holding a total of 14 patents. His work focuses on enhancing the efficiency and reliability of semiconductor devices.

Latest Patents

One of Min-Jae Lee's latest patents is titled "Defect detection structure of a semiconductor die, semiconductor device including the same and method of detecting defects in semiconductor die." This innovative semiconductor device comprises a semiconductor die, a defect detection structure, and an input-output circuit. The semiconductor die features a central region surrounded by a peripheral region, which includes various corner regions. The defect detection structure is strategically formed in the peripheral region and consists of multiple conduction loops that facilitate effective defect detection.

Career Highlights

Throughout his career, Min-Jae Lee has worked with leading companies in the technology sector, including Samsung Electronics Co., Ltd. and LG Display Co., Ltd. His experience in these organizations has allowed him to develop cutting-edge technologies that advance the semiconductor industry.

Collaborations

Min-Jae Lee has collaborated with notable professionals in his field, including Cheol-Se Kim and Ji-Hyun Jung. These partnerships have contributed to the successful development of his innovative patents.

Conclusion

Min-Jae Lee's contributions to semiconductor technology through his patents and collaborations highlight his role as a key innovator in the industry. His work continues to influence advancements in semiconductor devices and defect detection methods.

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