Seoul, South Korea

Min Ho Woo

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignees: Hyundai Motor Company, Kia Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Min Ho Woo. Retrieved from https://idiyas.com/inventor/min-ho-woo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Min Ho Woo: Inventor of a Leakage Inspection System

Introduction

Min Ho Woo is an inventor based in Seoul, South Korea. His patent work includes a system designed to detect leaks from inspection targets, with an approach that uses multiple inspection points and measures the amount of gas drawn through the system.

Latest Patents

Woo is associated with 1 patent: “Leakage Inspecting System for Inspection Target.” The invention supplies leak-inspection gas to a target and uses multiple inspection pipes positioned opposite inspection points to draw in gas that has escaped. A sensing component measures the amount of gas suctioned through the pipes, while a discharge component releases remaining gas from the target or suction system. This arrangement is designed to support leakage inspection across multiple points.

Career Highlights

Woo’s listed company affiliations include Hyundai Motor Company and Kia Corporation. His patent focuses on a practical inspection system for identifying leaks.

Collaborations

Jae Hyeon Park and In Sun Lee are listed as Woo’s coworkers. Their names are provided as professional associations, though specific roles in the patent are not stated.

Conclusion

Min Ho Woo’s patent describes a multi-point gas inspection system that combines suction, measurement, and discharge functions to assess leakage from an inspection target.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…