This inventor holds 1 USPTO granted patent. Top assignee: Tsi, Inc.. Active years: 1990.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1990
Title: Innovations of Miles R Finn in Laser Optical Measurement
Introduction
Miles R Finn is an accomplished inventor based in Minneapolis, MN (US). He has made significant contributions to the field of laser optical measurement, particularly through his innovative patent. His work focuses on enhancing the accuracy of laser optical measuring instruments, which has important applications in various industries.
Latest Patents
Miles R Finn holds a patent for a "Laser optical measuring device and method for stabilizing fringe pattern." This invention discloses methods and apparatus for improving the accuracy of laser optical measuring instruments by utilizing fringe pattern spacing. The apparatus includes a laser beam source, a beam splitter, and mirrors to deflect the emitted beams to a sensing volume. The design allows for automatic deflection of the beams in response to wavelength changes, thereby compensating for variations in fringe spacing and enhancing measurement accuracy.
Career Highlights
Finn is associated with TSI, Inc., where he applies his expertise in laser technology. His innovative approach has led to advancements in the precision of laser measurements, making significant impacts in the field. With a patent count of 1 patent, he continues to contribute to the development of cutting-edge measurement technologies.
Collaborations
Throughout his career, Miles R Finn has collaborated with notable colleagues, including Daniel C Bjorkquist and Stanley L Kaufman. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Miles R Finn's contributions to laser optical measurement technology exemplify the spirit of innovation. His patent reflects a commitment to enhancing measurement accuracy, which is crucial for various applications. His work continues to influence the field and inspire future advancements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
