Berkeley, CA, United States of America

Milan Edouard Delor

This inventor holds 1 USPTO granted patent. Top assignee: University of California. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Milan Edouard Delor. Retrieved from https://idiyas.com/inventor/milan-edouard-delor

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: The Innovative Work of Milan Edouard Delor

Introduction

Milan Edouard Delor, based in Berkeley, California, is an accomplished inventor with a focus on advanced optical technologies. His innovative spirit has led him to develop groundbreaking systems and methods that enhance our understanding of energy flow in electronic and semiconductor materials.

Latest Patents

Delor is credited with one significant patent: "Systems and methods using stroboscopic universal structure-energy flow correlation scattering microscopy." This patent presents a novel optical scattering microscope that employs a spatiotemporal approach, enabling researchers to measure energy flow across various materials with unprecedented precision.

Career Highlights

As a member of the University of California, Delor has made significant contributions to the field of optical sciences. His work not only furthers technological advancement but also provides valuable insights for future research in materials science and engineering.

Collaborations

Throughout his career, Delor has collaborated with notable professionals, including Naomi S Ginsberg, further enhancing the impact of his research. These partnerships combine expertise across disciplines, fostering innovation and expanding the applications of their findings.

Conclusion

Milan Edouard Delor is a key figure in the realm of optical technology, with a focus on energy flow in semiconductor materials. His patent represents a significant leap forward in microscopy techniques, showcasing his dedication to innovation in science and engineering.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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