Colfax, CA, United States of America

Miklos Perlaki

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1990.


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 155(Granted Patents)


Company Filing History:

goldMedal1 out of 834,411 
Other
 patents

Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: Miklos Perlaki - Innovator in Membrane Probe Technology

Introduction

Miklos Perlaki is a notable inventor based in Colfax, CA (US). He has made significant contributions to the field of technology with his innovative designs and patents. His work focuses on enhancing the functionality and efficiency of testing apparatuses.

Latest Patents

Miklos Perlaki holds a patent for a "Membrane probe with automatic contact scrub action." This invention is an apparatus designed to provide an automatic lateral scrubbing motion when a test membrane engages a device under test (DUT). The apparatus includes a fixed length flexure pivot assembly and a pair of variable length flexure pivot assemblies. It features signal traces, signal trace terminals, and contact bumps that facilitate the communication of electrical signals between the apparatus and the DUT. The membrane is configured to carry these signal traces and is secured over an aperture formed in the hexagonal translation stage, which is suspended by a carrier.

Career Highlights

Throughout his career, Miklos has demonstrated a commitment to innovation and excellence in his field. His patent reflects his ability to solve complex problems and improve existing technologies.

Collaborations

Miklos has collaborated with Richard E Huff, working together to advance their projects and share insights in their respective areas of expertise.

Conclusion

Miklos Perlaki's contributions to membrane probe technology exemplify his innovative spirit and dedication to improving testing apparatuses. His patent showcases his ability to create solutions that enhance functionality and efficiency in technology.

Profile summary based on public USPTO records.
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