Espoo, Finland

Mikko Vaahteranoksa

This inventor holds 1 USPTO granted patent. Top assignee: Microsoft Technology Licensing, LLC. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mikko Vaahteranoksa. Retrieved from https://idiyas.com/inventor/mikko-vaahteranoksa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Mikko Vaahteranoksa and Camera Calibration Innovation.

Introduction

Mikko Vaahteranoksa is an inventor associated with Espoo, Finland. His patent work includes an invention for obtaining calibration data from a camera, and he is associated with Microsoft Technology Licensing, LLC.

Latest Patents

Vaahteranoksa is credited with 1 patent: “Obtaining Calibration Data of a Camera.” The invention describes an apparatus that detects when a connected camera is in a dark environment and initiates a calibration sequence. During that sequence, the camera captures multiple images using different sets of shooting parameters. The images are analyzed to obtain calibration data, which is then stored in the apparatus’s memory.

Career Highlights

The patent describes a process designed to gather camera calibration data in low-light conditions. It combines environmental detection, automated image capture, image analysis, and data storage in a single sequence.

Collaborations

Vaahteranoksa’s listed coworkers include Jean-Luc Olivés and Petteri Valve. His patent is associated with Microsoft Technology Licensing, LLC.

Conclusion

Mikko Vaahteranoksa’s camera-calibration patent presents an automated approach to collecting and storing calibration data when a camera is operating in a dark environment.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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