Hyogo, Japan

Mikio Tachibana


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 25(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Mikio Tachibana: Innovator in Surface Inspection Technology.

Introduction

Mikio Tachibana is a notable inventor based in Hyogo, Japan. He has made significant contributions to the field of surface inspection technology. His innovative approach has led to the development of a unique apparatus designed to detect surface defects.

Latest Patents

Mikio Tachibana holds a patent for a "Surface Undulation Inspection Apparatus." This apparatus is engineered to identify defects in fine undulations on the surfaces of various specimens. The technology utilizes a patterning light source and an image pickup lens to enhance the detection of surface irregularities. The system is designed to specify a principal ray passing through the specimen, allowing for precise identification of local surface defects.

Career Highlights

Mikio Tachibana is associated with Mitsubishi Denki Kabushiki Kaisha, a leading company in the technology sector. His work has been instrumental in advancing inspection methodologies, contributing to improved quality control processes in manufacturing.

Collaborations

Mikio Tachibana has collaborated with Mitsuhito Kamei, further enhancing the development of innovative inspection technologies. Their combined expertise has led to advancements in the field.

Conclusion

Mikio Tachibana's contributions to surface inspection technology exemplify the impact of innovation in enhancing manufacturing processes. His patented apparatus represents a significant step forward in defect detection, showcasing the importance of continuous improvement in technology.

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