Tokyo, Japan

Miki Kuwajima

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Jasco Corporation. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Miki Kuwajima. Retrieved from https://idiyas.com/inventor/miki-kuwajima

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Miki Kuwajima: Innovator in Differential Refractive Index Measurement

Introduction

Miki Kuwajima is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of optical measurement technology. Her innovative work focuses on improving the accuracy and reliability of differential refractive index measurements.

Latest Patents

Kuwajima holds a patent for a "Differential refractive index measurement method, measurement device, and measurement program." This invention addresses the challenge of reducing noise in the output signal of a differential refractive index detection part. The method involves sending a sample liquid and a reference liquid to their respective cells and detecting changes in light transmission. By adjusting the phase difference between the sample and reference pumps, the invention effectively cancels out noise, enhancing measurement precision. She has 1 patent to her name.

Career Highlights

Kuwajima is currently employed at Jasco Corporation, a company known for its advanced analytical instruments. Her role involves research and development in optical measurement technologies. Her expertise has positioned her as a key figure in her field.

Collaborations

Kuwajima collaborates with Tomohiro Moteki, a fellow innovator in the same organization. Together, they work on enhancing measurement techniques and developing new technologies.

Conclusion

Miki Kuwajima's contributions to differential refractive index measurement demonstrate her commitment to innovation in optical technology. Her work continues to influence advancements in measurement accuracy and reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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