Raleigh, NC, United States of America

Mikal E Saltveit, Jr

This inventor holds 2 USPTO granted patents. Top assignee: Michigan State University. Active years: 1983.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mikal E Saltveit, Jr. Retrieved from https://idiyas.com/inventor/mikal-e-saltveit-jr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 37(Granted Patents)


Company Filing History:


Years Active: 1983

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2 patents (USPTO):Explore Patents

Title: Mikal E. Saltveit, Jr.: Inventor of Gas-Sensing Technology

Introduction

Mikal E. Saltveit, Jr. is an inventor associated with Michigan State University. Based in Raleigh, North Carolina, he is credited with 2 patents.

Latest Patents

Saltveit’s listed patent, “Gas Sensing Apparatus and Method,” describes technology for detecting and measuring small quantities of selected oxidizable gases in a carrier gas. The apparatus uses two semiconductor sensing elements arranged in parallel, allowing changes in their electrical resistance to be compared as gas concentrations vary.

The patent also describes a method for assessing fruit maturity and ripeness by detecting ethylene in a fruit’s internal atmosphere. The method can use the described semiconductor sensors or other gas-sensing devices with variable resistance.

Career Highlights

Saltveit’s patent work connects gas-sensing technology with agricultural applications. Detecting ethylene offers a way to evaluate fruit maturity and ripeness through measurements of gases released within the fruit.

Collaborations

The provided information lists David Ross Dilley and Julian J. Lee as Saltveit’s coworkers. His work is associated with Michigan State University.

Conclusion

Mikal E. Saltveit, Jr.’s patent record highlights an approach to measuring oxidizable gases and applying gas detection to the assessment of fruit ripeness.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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