Palo Alto, CA, United States of America

Mihnea Olteanu

This inventor holds 1 USPTO granted patent. Top assignee: Vmware, Inc.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mihnea Olteanu. Retrieved from https://idiyas.com/inventor/mihnea-olteanu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Mihnea Olteanu: Inventor in Distributed Computing

Introduction

Mihnea Olteanu is an inventor based in Palo Alto, California, and is associated with VMware, Inc. His patent work addresses the efficient distribution of virtual-machine images in distributed computing environments.

Latest Patents

Olteanu is named on 1 patent: “Methods and Subsystems That Efficiently Distribute VM Images in Distributed Computing Systems.” The invention describes methods and systems for distributing virtual-machine images among servers in large infrastructure-as-a-service platforms. Its approaches store images across distributed systems using different distribution models to balance computing-resource use and timing requirements, helping servers instantiate virtual machines efficiently.

Career Highlights

Olteanu’s listed patent reflects work on infrastructure software and the practical challenges of deploying virtual machines across distributed systems. He is associated with VMware, Inc., a company known for virtualization and cloud-computing technologies.

Collaborations

The provided information identifies Xin Yao and Bharath Siravara as Olteanu’s coworkers. Their shared professional context is VMware, Inc.

Conclusion

Mihnea Olteanu’s patent focuses on improving how virtual-machine images are distributed and instantiated, addressing an important efficiency challenge in large-scale distributed computing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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