Berlin, Germany

Mies Stephan

This inventor holds 1 USPTO granted patent. Top assignee: Korsch Ag. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mies Stephan. Retrieved from https://idiyas.com/inventor/mies-stephan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Mies Stephan - Innovator in Tablet Press Technology

Introduction

Mies Stephan is a notable inventor based in Berlin, Germany. He has made significant contributions to the field of tablet press technology, particularly through his innovative designs and methods.

Latest Patents

Mies Stephan holds a patent for a device and method for monitoring a tablet press machine, preferably during continuous operation, by means of a measuring device attached to a press punch. This invention relates to a punch for a tableting machine, which features a measuring device that can function in an energy self-sufficient manner, independent of the power supply to the tableting machine. The patent also encompasses a tableting machine that incorporates this advanced punch and outlines a method for monitoring the machine during operation.

Career Highlights

Mies Stephan is currently employed at Korsch AG, a company renowned for its expertise in tablet press technology. His work focuses on enhancing the efficiency and reliability of tablet manufacturing processes.

Collaborations

Mies collaborates with Ingo Klaer, contributing to the development of innovative solutions in their field.

Conclusion

Mies Stephan's contributions to tablet press technology exemplify the spirit of innovation and dedication to improving manufacturing processes. His patent reflects a significant advancement in the industry, showcasing his expertise and commitment to excellence.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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