Tokyo, Japan

Mieko Ariga

This inventor holds 1 USPTO granted patent. Top assignee: Yokogawa Medical Systems, Limited. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mieko Ariga. Retrieved from https://idiyas.com/inventor/mieko-ariga

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Mieko Ariga: Innovator in Image Display Technology

Introduction

Mieko Ariga is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of image display technology. With a focus on innovation, Mieko has developed a patent that showcases her expertise and creativity.

Latest Patents

Mieko Ariga holds a patent for an image display device. This invention reflects her commitment to advancing technology in the medical field. Her work is recognized for its potential impact on various applications.

Career Highlights

Mieko is currently employed at Yokogawa Medical Systems, Limited. Her role at the company allows her to apply her innovative ideas in a practical setting. She has demonstrated a strong ability to merge technology with healthcare solutions.

Collaborations

Mieko has collaborated with notable colleagues, including Yasuo Imanishi and Muneomi Hosokawa. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Mieko Ariga is a trailblazer in the field of image display technology. Her contributions and collaborations highlight her dedication to innovation. With her patent and ongoing work, she continues to make a significant impact in her industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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