Hyogo, Japan

Michiya Kurohashi

This inventor holds 1 USPTO granted patent. Top assignee: Kobe Steel, Ltd.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michiya Kurohashi. Retrieved from https://idiyas.com/inventor/michiya-kurohashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Michiya Kurohashi: Innovator in Tire Balance Measurement

Introduction

Michiya Kurohashi is a notable inventor based in Hyogo, Japan. He has made significant contributions to the field of tire balance measurement technology. His innovative approach addresses common challenges faced in the industry.

Latest Patents

Kurohashi holds a patent for a tire balance measuring device. This invention minimizes the influence of the inclination of a lock shaft on the measured value. The device includes a sensor that measures the inclination of the lock shaft and a computing unit that calculates the change in tire unbalance. This technology ensures accurate balance measurement even when the lock shaft is inclined at random angles.

Career Highlights

Kurohashi is associated with Kobe Steel, Ltd., a prominent company in the steel and manufacturing sector. His work has been instrumental in advancing tire measurement technologies, contributing to improved safety and performance in the automotive industry.

Collaborations

Kurohashi has collaborated with talented coworkers, including Naofumi Kanei and Maiko Nakayama. Their combined expertise has fostered innovation and development in their projects.

Conclusion

Michiya Kurohashi's contributions to tire balance measurement technology exemplify the importance of innovation in engineering. His patent reflects a commitment to enhancing accuracy and efficiency in the automotive sector.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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