Kyoto, Japan

Michitaka Kato

This inventor holds 1 USPTO granted patent. Top assignee: Omron Tateisi Electronics Co.. Active years: 1987.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michitaka Kato. Retrieved from https://idiyas.com/inventor/michitaka-kato

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 1987

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1 patent (USPTO):Explore Patents

Title: Michitaka Kato: Innovator in Pattern Outline Tracking Technology

Introduction

Michitaka Kato is a prominent inventor based in Kyoto, Japan. He is known for his innovative contributions to the field of pattern recognition technology. His work has significantly impacted various applications in image processing and recognition systems.

Latest Patents

Kato holds a patent for a "Pattern outline tracking method and apparatus." This invention provides a comprehensive system for recognizing and tracking patterns in images. The system includes functions such as scanning an object, comparing video signal levels, and deriving partial patterns from binary signals. It effectively matches these patterns against reference patterns to track outlines accurately.

Career Highlights

Throughout his career, Michitaka Kato has made significant strides in the field of electronics and image processing. His work at Omron Tateisi Electronics Co. has allowed him to develop cutting-edge technologies that enhance pattern recognition capabilities. Kato's innovative approach has led to advancements that benefit various industries.

Collaborations

Kato has collaborated with notable colleagues, including Kazuhiko Saka and Atsushi Hisano. These partnerships have fostered a creative environment that encourages the development of new technologies and solutions in the field.

Conclusion

Michitaka Kato's contributions to pattern outline tracking technology exemplify his dedication to innovation. His patent and collaborative efforts continue to influence advancements in image processing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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