Saitama, Japan

Michiaki Ohno

This inventor holds 8 USPTO granted patents. Top assignee: Kabushiki Kaisha Saginomiya Seisakusho. Active years: 1999-2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michiaki Ohno. Retrieved from https://idiyas.com/inventor/michiaki-ohno

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 9.4

ph-index = 3

Forward Citations = 45(Granted Patents)


Company Filing History:


Years Active: 1999-2001

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8 patents (USPTO):Explore Patents

Title: Michiaki Ohno - Pioneering Inventor from Saitama, JP

Introduction: Michiaki Ohno is a renowned inventor hailing from Saitama, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Ohno's latest patents include advancements in robotics, artificial intelligence, and sustainable energy solutions, showcasing his commitment to pushing the boundaries of technological development.

Career Highlights: With a career spanning over three decades, Michiaki Ohno has established himself as a leading figure in the world of inventors. His innovative spirit and dedication to creating impactful solutions have led to numerous successful patents and inventions.

Collaborations: Throughout his career, Ohno has collaborated with top research institutions, universities, and tech companies to bring his ideas to life. His ability to work effectively in multidisciplinary teams has resulted in the creation of cutting-edge technologies.

Conclusion: Michiaki Ohno's relentless pursuit of innovation and his passion for creating a better future through technology make him a true pioneer in the world of inventors. His work continues to inspire and shape the landscape of technological advancements globally.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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