Saclay, France

Michel Lacombat

This inventor holds 1 USPTO granted patent. Top assignee: Micro-Controle. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michel Lacombat. Retrieved from https://idiyas.com/inventor/michel-lacombat-v4lgocad

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 41(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Michel Lacombat: Innovator in Optical Measurement Technology

Introduction

Michel Lacombat is a prominent inventor based in Saclay, France. He has made significant contributions to the field of optical measurement technology. His innovative work has led to the development of a unique patent that showcases his expertise and creativity.

Latest Patents

Michel Lacombat holds a patent for an optical measurement device and method. This invention represents a significant advancement in the field, providing new solutions for precise measurements in various applications. His patent portfolio includes 1 patent, highlighting his focused contributions to innovation.

Career Highlights

Michel Lacombat is currently employed at Micro-Controle, a company known for its dedication to developing advanced measurement technologies. His role at Micro-Controle allows him to apply his inventive skills and collaborate with other experts in the field.

Collaborations

One of his notable collaborators is Olivier Hignette. Together, they work on projects that push the boundaries of optical measurement technology. Their partnership exemplifies the importance of teamwork in driving innovation.

Conclusion

Michel Lacombat's contributions to optical measurement technology through his patent and work at Micro-Controle demonstrate his commitment to innovation. His career reflects the impact that dedicated inventors can have on advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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