This inventor holds 2 USPTO granted patents. Top assignee: Université De Rennes I. Active years: 1987-1988.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1987-1988
Title: Michel De Burgat: Innovator in Testing Technologies
Introduction
Michel De Burgat is a notable inventor based in Rennes, France. He has made significant contributions to the field of testing technologies, particularly in the area of passive components. With a total of 2 patents to his name, his work has advanced the methods used to evaluate electronic components.
Latest Patents
Michel De Burgat's latest patents include innovative methods and apparatuses for rapidly testing passive components. One of his patents describes a method for testing passive two-terminal devices in the VHF range. This apparatus features an electrical signal generator with a variable frequency, a distributed constant line, and a resistive .pi. network. This setup allows for the direct measurement of incident and reflected waves, enabling the determination of the reflection coefficient of the tested device. Another patent focuses on rapidly testing capacitors and dielectrics. This apparatus includes a measuring unit that works in conjunction with a reference impedance, a clock for applying stimulating pulses, and a processing unit that analyzes the sampled data to deduce the parameters of the tested item using a Foster model.
Career Highlights
Michel De Burgat is affiliated with the University of Rennes I, where he continues to contribute to research and innovation in his field. His work has been instrumental in enhancing the efficiency and accuracy of testing methods for electronic components.
Collaborations
Throughout his career, Michel has collaborated with esteemed colleagues such as Andre Le Traon and Jean-Claude Pilet. These partnerships have fostered a collaborative environment that promotes innovation and the sharing of ideas.
Conclusion
Michel De Burgat stands out as a significant figure in the realm of testing technologies. His patents reflect a commitment to advancing the methods used in evaluating electronic components, showcasing his expertise and innovative spirit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile