Warsaw, Poland

Michal Ziemczonok


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Michal Ziemczonok: Innovator in Refractive Index Standards

Introduction

Michal Ziemczonok is a notable inventor based in Warsaw, Poland. He has made significant contributions to the field of optics, particularly in the development of refractive index standards. His innovative work has implications for various measurement systems and optical technologies.

Latest Patents

Ziemczonok holds a patent for a "Refractive index distribution standard." This invention is characterized by a three-dimensional object that contains a base medium and regions of variable size and distance with a refractive index different from that of the base medium. The difference between the refractive index of these regions and the base medium is not greater than 0.04. Notably, at least one of the regions consists of a set of at least two prisms, cylinders, or coaxial rings of variable size and distance. These regions have dimensions in at least one direction similar to the resolving power of the measurement system under assessment. Additionally, at least one of the regions is sphere-like or ellipsoid-like in shape. This patent showcases Ziemczonok's expertise in optical measurement standards.

Career Highlights

Ziemczonok is affiliated with Politechnika Warszawska, where he contributes to research and development in optics and related fields. His academic background and professional experience have positioned him as a key figure in his area of expertise.

Collaborations

Ziemczonok has collaborated with notable colleagues, including Arkadiusz Kus and Małgorzata Kujawinska. These partnerships have fostered innovation and advancement in their shared research interests.

Conclusion

In summary, Michal Ziemczonok is a distinguished inventor whose work on refractive index distribution standards has made a significant impact in the field of optics. His contributions continue to influence measurement systems and optical technologies.

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