The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2025

Filed:

May. 20, 2020
Applicant:

Politechnika Warszawska, Warsaw, PL;

Inventors:

Michal Ziemczonok, Warsaw, PL;

Arkadiusz Kus, Warsaw, PL;

Małgorzata Kujawinska, Lomianki, PL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/41 (2006.01);
U.S. Cl.
CPC ...
G01N 21/41 (2013.01); G01N 2201/13 (2013.01);
Abstract

Refractive index distribution standard in the form of a three-dimensional object which contains in its volume a base medium and regions of variable size and distance with a refractive index other than that of the base medium, characterised in that the difference between the refractive index of said regions and the refractive index of the base medium is not greater than 0.04, at least one of the regions is a set of at least two prisms or cylinders or coaxial rings of variable size and distance, having a dimension in at least one direction similar to the resolving power of the measurement system under assessment and at least one of the regions is sphere-like or ellipsoid-like in shape.


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