Berkeley, CA, United States of America

Michal Wojcik

This inventor holds 1 USPTO granted patent. Top assignee: University of California. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michal Wojcik. Retrieved from https://idiyas.com/inventor/michal-wojcik

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Michal Wojcik: Innovator in Graphene Visualization

Introduction

Michal Wojcik is a prominent inventor based in Berkeley, CA (US). He has made significant contributions to the field of materials science, particularly in the visualization of graphene and its defects. His innovative approach has garnered attention in both academic and industrial circles.

Latest Patents

Wojcik holds a patent for a "Method for direct optical visualization of graphene and its nanoscale defects on transparent substrates." This patent provides methods for the direct optical visualization of graphene and its nanoscale defects on transparent substrates, which is crucial for advancing research and applications in nanotechnology.

Career Highlights

Wojcik is affiliated with the University of California, where he conducts research and collaborates with other experts in the field. His work has been instrumental in enhancing the understanding of graphene, a material known for its exceptional properties.

Collaborations

Some of his notable coworkers include Wan Li and Seonah Moon, who have contributed to various projects alongside Wojcik. Their collaborative efforts have furthered the research in graphene visualization and its applications.

Conclusion

Michal Wojcik's innovative work in the field of graphene visualization exemplifies the impact of research on advancing technology. His contributions continue to inspire future developments in materials science.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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