Barlinek, Poland

Michal Postolski

USPTO Granted Patents = 2 

Average Co-Inventor Count = 4.4

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2017-2025

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2 patents (USPTO):Explore Patents

Title: Michal Postolski: Innovator in Particle Beam Technology

Introduction

Michal Postolski is a notable inventor based in Barlinek, Poland. He has made significant contributions to the field of particle beam microscopy, holding 2 patents that showcase his innovative methods and devices. His work is instrumental in advancing the capabilities of particle beam technology.

Latest Patents

Postolski's latest patents include a "Method for positioning objects in a particle beam microscope with the aid of a flexible particle beam barrier." This method involves positioning a movable object within a sample chamber of a particle beam microscope, utilizing a flexible barrier to enhance precision. The process includes defining a barrier region, scanning it with a beam of charged particles, and monitoring interaction signals to determine the object's position relative to the barrier.

Another significant patent is the "Method for analyzing and/or processing an object as well as a particle beam device for carrying out the method." This invention focuses on imaging and processing objects using a particle beam device, which can be an electron or ion beam device. The method involves controlling various parameters to accurately analyze the object's surface and identify specific features for further processing.

Career Highlights

Michal Postolski is currently employed at Carl Zeiss Microscopy GmbH, a leading company in the field of microscopy. His role involves developing advanced technologies that enhance the functionality and accuracy of particle beam devices. His expertise in this area has positioned him as a key player in the industry.

Collaborations

Throughout his career, Postolski has collaborated with esteemed colleagues such as Josef Biberger and Lorenz Lechner. These partnerships have fostered innovation and contributed to the successful development of new technologies in particle beam microscopy.

Conclusion

Michal Postolski's contributions to particle beam technology through his patents and work at Carl Zeiss Microscopy GmbH highlight his role as a leading inventor in this field. His innovative methods continue to push the boundaries of what is possible in microscopy.

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