Leidschendam, Netherlands

Michal Pasternak

This inventor holds 2 USPTO granted patents. Top assignees: Fnv IP B.v., Fugro N.v.. Active years: 2023-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michal Pasternak. Retrieved from https://idiyas.com/inventor/michal-pasternak

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2023-2026

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Michal Pasternak: Innovator in 3D Spatial Analysis

Introduction

Michal Pasternak is a notable inventor based in Leidschendam, Netherlands. He has made significant contributions to the field of image analysis, particularly in the context of 3D spatial properties. His innovative approach combines various technologies to enhance the accuracy and efficiency of spatial measurements.

Latest Patents

Pasternak holds a patent for a "Method of and apparatus for analyzing images." This invention involves an apparatus designed to determine spatial properties in a 3D space. The apparatus includes a physical pointer, a camera, and a position and orientation measurement system. The system is capable of capturing image data of a pattern on a first object while determining the camera's position and orientation. This allows for precise measurements of surface areas in relation to the physical pointer.

Career Highlights

Currently, Michal Pasternak is employed at Fugro N.V., a company known for its expertise in geotechnical and survey services. His work at Fugro involves applying his patented technology to real-world applications, enhancing the company's capabilities in spatial analysis.

Collaborations

Pasternak collaborates with talented professionals such as Diego Dias Bispo Carvalho and Evert Schippers. These collaborations foster innovation and contribute to the advancement of technology in their field.

Conclusion

Michal Pasternak's contributions to the field of image analysis and spatial measurement demonstrate his commitment to innovation. His patent and work at Fugro N.V. highlight the importance of integrating technology to solve complex problems in 3D spatial analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…