Petach Tikva, Israel

Michal Barak

This inventor holds 1 USPTO granted patent. Top assignee: Bmc Software, Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michal Barak. Retrieved from https://idiyas.com/inventor/michal-barak-a61l7p2x

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Michal Barak: Innovator in Semantic Data Classification

Introduction

Michal Barak is a notable inventor based in Petach Tikva, Israel. He has made significant contributions to the field of data management through his innovative patent. His work focuses on enhancing the efficiency and accuracy of semantic classification of data.

Latest Patents

Michal Barak holds a patent titled "Semantic classification for data management." This patent describes systems and techniques that enable fast and accurate semantic classification of data. The methods outlined in the patent allow for efficient classification using a minimal required set of resources. Additionally, the techniques are designed to improve dynamically over time, ensuring that similar data can be recognized more quickly and with fewer resources in subsequent iterations.

Career Highlights

Currently, Michal Barak is employed at BMC Software, Inc., where he continues to develop innovative solutions in data management. His expertise in semantic classification has positioned him as a valuable asset in his field.

Collaborations

One of his notable coworkers is Eyal Dahari, with whom he collaborates on various projects within the company.

Conclusion

Michal Barak's contributions to semantic data classification demonstrate his commitment to innovation and efficiency in data management. His work not only enhances current methodologies but also paves the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…