Caen, France

Michaël Obein

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Centre National Detudes Spatiales. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michaël Obein. Retrieved from https://idiyas.com/inventor/michaël-obein

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile



Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Michaël Obein: Innovator in Integrated Circuit Technology

Introduction

Michaël Obein is a notable inventor based in Caen, France. He has made significant contributions to the field of integrated circuit technology. His innovative approach has led to the development of a unique method for exposing integrated circuits.

Latest Patents

Michaël Obein holds a patent for a method and installation for exposing the surface of an integrated circuit. This invention relates to a method for exposing an integrated circuit by ablating the polymer coating initially covering the integrated circuit. The method is characterized by the combined application of laser radiation and plasma onto the coating initially covering the integrated circuit. He has 1 patent to his name.

Career Highlights

Obein is associated with the Centre National d'Études Spatiales, where he applies his expertise in integrated circuit technology. His work at this prestigious institution highlights his commitment to advancing technology in the aerospace sector.

Collaborations

Michaël Obein collaborates with Romain Desplats, contributing to innovative projects within their field. Their partnership exemplifies the collaborative spirit that drives technological advancements.

Conclusion

Michaël Obein's contributions to integrated circuit technology through his innovative patent demonstrate his role as a key inventor in the field. His work continues to influence advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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