Michael W Taylor

Title: Michael W. Taylor: Innovator in Semiconductor Testing Technology

Introduction

Michael W. Taylor is a notable inventor based in Oakland, CA (US). He has made significant contributions to the field of semiconductor technology, particularly in the area of testing and locating areas of interest on workpieces. His innovative approach has led to the development of a unique apparatus that enhances the efficiency and accuracy of semiconductor testing.

Latest Patents

Michael W. Taylor holds a patent for an "Apparatus for locating and testing areas of interest on a workpiece." This invention relates to a method and apparatus for identifying and testing the location of areas of interest on a workpiece, specifically unmasked areas on a semiconductor wafer. The method involves scanning the surface of the wafer with a search beam of radiation. The power of the reflected search beam is influenced by the optical reflectivity of the surface. By measuring the power of the reflected search beam, the invention can identify the location of areas to be measured, distinguishing between unmasked and masked areas.

Career Highlights

Michael W. Taylor has worked at Therma-Wave, Inc., where he has applied his expertise in semiconductor technology. His work has been instrumental in advancing the methods used for testing semiconductor wafers, contributing to the overall efficiency of the manufacturing process.

Collaborations

Throughout his career, Michael has collaborated with notable colleagues, including John Schuur and David L. Willenborg. These collaborations have further enriched his work and have led to advancements in the field of semiconductor testing.

Conclusion

Michael W. Taylor's contributions to semiconductor technology through his innovative patent demonstrate his commitment to enhancing testing methods in the industry. His work continues to influence the field and improve the efficiency of semiconductor manufacturing processes.